Integrated Circuit and Method for Testing, 1998, EP98304773.9
Method for Achieving Scan Testability of an Integrated Circuit
Including
Multiple Clock Systems, 2000, EP00310084.9
Boundary Scan Delay Chain for Crosschip Delay Measurement, 2001,
EP01301472.5
Delayed Flash Clear Scan Flip-Flop To Be Implemented in Complex
Integrated
Circuit Designs, 2001, EP01306895.2
Functional-Concurrent Power, Current and Temperature Characterization of Complex ASIC/SOCs by "Underfloor Heating" with Special Frequency-Controlled Scan-FFs, 2002 (onhold)